IEEE - Institute of Electrical and Electronics Engineers, Inc. - Confidence intervals on the reliability of repairable systems

Proceedings of Annual Reliability and Maintainability Symposium (RAMS)

Author(s): Crow, L.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Atlanta, GA, USA, USA
Conference Date: 26 January 1993
Page(s): 126 - 134
ISBN (Paper): 0-7803-0943-X
DOI: 10.1109/RAMS.1993.296866
Regular:

The author discusses confidence intervals procedures on the failure intensity and reliability function appropriate when failure data are generated by multiple systems. He assumes that one is... View More

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