IEEE - Institute of Electrical and Electronics Engineers, Inc. - Expert systems and strategic testing

Proceedings of Annual Reliability and Maintainability Symposium (RAMS)

Author(s): Brauer, D.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Atlanta, GA, USA, USA
Conference Date: 26 January 1993
Page(s): 469 - 475
ISBN (Paper): 0-7803-0943-X
DOI: 10.1109/RAMS.1993.296813
Regular:

It is pointed out that combining strategic planning with expert system technology enables the engineer or manager to define quickly the 'best' or 'optimal' test program for a given product... View More

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