IEEE - Institute of Electrical and Electronics Engineers, Inc. - Time templates for discrete event fault monitoring in manufacturing systems

Proceedings of 1994 American Control Conference - ACC '94

Author(s): Holloway, L.E. ; Chand, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1994
Conference Location: Baltimore, MD, USA, USA
Conference Date: 29 June 1994
Volume: 1
ISBN (Paper): 0-7803-1783-1
DOI: 10.1109/ACC.1994.751830
Regular:

The input and output signals of automated manufacturing systems can be characterized as observed time functions of discrete events. Fault monitoring is the online analysis of the process... View More

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