IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transient Response Characteristics of Capacitive Potential Devices

Author(s): Andrew Sweetana
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1971
Volume: PAS-90
Page(s): 1,989 - 2,001
ISSN (Paper): 0018-9510
DOI: 10.1109/TPAS.1971.292994
Regular:

Full voltage line to ground fault tests are performed on typical potential devices and the subsidence transient recorded. To show the worst case of residual voltage, faults are initiated while the... View More

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