IEEE - Institute of Electrical and Electronics Engineers, Inc. - A phase method to quantify ultrasonic scattered far-field from defects

Author(s): Kitahara, M. ; Nakagawa, K. ; Musha, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Orlando, FL, USA, USA
Conference Date: 8 December 1991
DOI: 10.1109/ULTSYM.1991.234246
Regular:

The integral representation for the phase shifts is obtained with the help of the far-field integral representation for scattered wave fields. The phase shifts are determined numerically for... View More

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