IEEE - Institute of Electrical and Electronics Engineers, Inc. - A critical success factors/applications portfolio approach to determining MIS success

Author(s): Park, S.W. ; McLean, E.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Kauai, HI, USA
Conference Date: 8 January 1991
Volume: iv
DOI: 10.1109/HICSS.1991.184069
Regular:

Many independent variables have been proposed to help 'explain' the dependent variable, MIS success. The authors describe a new approach, combining a determination of the firm's critical success... View More

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