IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation effects in fully-depleted CMOS/SOS

Author(s): Rios, R. ; Smeltzer, R.K. ; Garcia, G.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Vail Valley, CO, USA, USA
Conference Date: 1 October 1991
Page(s): 44 - 45
ISBN (Paper): 0-7803-0184-6
DOI: 10.1109/SOI.1991.162848
Regular:

Device modeling was used to investigate features of thin-film devices and to explore the consequences of radiation exposure. A simple model for radiation-induced charge accumulation at the... View More

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