IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimized Redundancy Selection Based On Failure-related Yield Model For 64Mb DRAM And Beyond

Author(s): Kikuda, S. ; Miyamoto, H. ; Mori, S. ; Niiro, M. ; Yarrada, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: San Francisco, CA, USA, USA
Conference Date: 13 February 1991
Page(s): 104 - 105
ISBN (Paper): 0-87942-644-6
DOI: 10.1109/ISSCC.1991.689082
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