IEEE - Institute of Electrical and Electronics Engineers, Inc. - 7ns 4Mb BICMOS SRAM With Parallel Testing Circuit

Author(s): Okajima, Y. ; Sato, Y. ; Kurosaki, K. ; Yamada, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: San Francisco, CA, USA, USA
Conference Date: 13 February 1991
Page(s): 54 - 289
ISBN (Paper): 0-87942-644-6
DOI: 10.1109/ISSCC.1991.689061
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