IEEE - Institute of Electrical and Electronics Engineers, Inc. - Content addressable memory for flash redundancy

Author(s): Jex, J. ; Baker, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Victoria, BC, Canada
Conference Date: 9 May 1991
ISBN (Paper): 0-87942-638-1
DOI: 10.1109/PACRIM.1991.160846
Regular:

The authors describe content addressable memory (CAM) used on a 1-Mb flash memory. Yield is improved by replacing defective columns containing fatal random defects. The CAM provides the address of... View More

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