IEEE - Institute of Electrical and Electronics Engineers, Inc. - Binarisation of various images by detecting local thresholds with a validation test

Author(s): Chehdi, K. ; Coquin, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Victoria, BC, Canada
Conference Date: 9 May 1991
ISBN (Paper): 0-87942-638-1
DOI: 10.1109/PACRIM.1991.160813
Regular:

The threshold method is one of the most important stages in the image pattern recognition chain when the object to be modeled does not contain texture. The authors present an efficient threshold... View More

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