IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault models for analog-to-digital converters

Author(s): Soma, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Victoria, BC, Canada
Conference Date: 9 May 1991
ISBN (Paper): 0-87942-638-1
DOI: 10.1109/PACRIM.1991.160786
Regular:

The author studies the fault models of an analog-to-digital converter (ADC) and relies on defect statistics (C. Stapper, 1985 and W. Maly et al., 1984) to derive the models according to the... View More

Advertisement