IEEE - Institute of Electrical and Electronics Engineers, Inc. - The effect of low energy protons on silicon solar cells with simulated coverglass cracks

Author(s): Gasner, S. ; Anspaugh, B. ; Francis, R. ; Marvin, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Las Vegas, NV, USA
Conference Date: 7 October 1991
ISBN (Paper): 0-87942-636-5
DOI: 10.1109/PVSC.1991.169446
Regular:

Results of a series of low-energy proton (LEP) tests are presented. The purpose of the tests was to investigate the effect of low-energy protons on the electrical performance of solar cells with... View More

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