IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep level transient spectroscopy on CuInSe/sub 2/ junctions

Author(s): Shih, I. ; Li, A.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Las Vegas, NV, USA
Conference Date: 7 October 1991
ISBN (Paper): 0-87942-636-5
DOI: 10.1109/PVSC.1991.169381
Regular:

In order to investigate defects in monocrystalline CuInSe/sub 2/ solar cells DLTS (deep level transient spectroscopy) measurements were performed on both In- or Bi-diffused homojunctions and... View More

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