IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic inspection of assembled PC board via highlight separation and dual channel processing

Author(s): Park, J.-S. ; Tou, J.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Sacramento, CA, USA
Conference Date: 9 April 1991
ISBN (Paper): 0-8186-2163-X
DOI: 10.1109/ROBOT.1991.132039
Regular:

The design of an automated inspection system for electronic components on a printed circuit board is presented. The inspection system employs several unique methodologies. They are (1) a normal... View More

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