IEEE - Institute of Electrical and Electronics Engineers, Inc. - Classification of complex patterns for surface inspection

Author(s): Cho, K.J. ; Han, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Sacramento, CA, USA
Conference Date: 9 April 1991
ISBN (Paper): 0-8186-2163-X
DOI: 10.1109/ROBOT.1991.131885
Regular:

The authors propose a method of statistical visual pattern recognition with an optimum organizational feature set which can be applied to the classification of complex 2D shapes. This method can... View More

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