IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault simulation for multiple faults using shared BDD representation of fault sets

Author(s): Takahashi, N. ; Ishiura, N. ; Yajima, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 550 - 553
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185329
Regular:

The authors propose a novel fault simulation technique for multiple faults. In order to handle a large number of multiple faults, sets of multiple faults are represented by Boolean functions, in... View More

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