IEEE - Institute of Electrical and Electronics Engineers, Inc. - The impedance fault model and design for robust impedance fault testability

Author(s): Sloan, M.D. ; Rogers, W.A. ; Shoroff, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 504 - 507
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185316
Regular:

It is pointed out that advanced submicron CMOS processes result in failure mechanisms that tend to be increasingly analog in nature. They are not adequately covered by stuck-at, stuck-on, or... View More

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