IEEE - Institute of Electrical and Electronics Engineers, Inc. - A signal-driven discrete relaxation technique for architectural level test generation

Author(s): Lee, J. ; Patel, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 458 - 461
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185303
Regular:

A novel architectural level test generation methodology is proposed to solve both data flow path conflicts and data flow value conflicts. For each pattern to be justified at a high level, an... View More

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