IEEE - Institute of Electrical and Electronics Engineers, Inc. - Synthesis for testability techniques for asynchronous circuits

Author(s): Keutzer, K. ; Lavagno, L. ; Sangiovanni-Vincentelli, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 326 - 329
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185266
Regular:

The authors present techniques which guarantee both hazard-free operation and hazard-free robust path-delay-fault testability at the expense of possibly adding test inputs. They also give a set of... View More

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