IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built-in self-test in multi-port RAMs

Author(s): Castro, A.V. ; Nicolaidis, M. ; Lestrat, P. ; Courtois, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 248 - 251
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185244
Regular:

The authors present a novel approach to the test of multi-port RAMs. A novel fault model that takes into account complex couplings resulting from simultaneous access of memory cells is used in... View More

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