IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of random test vector generation strategies

Author(s): Debany, W.H., Jr. ; Hartmann, C.R.P. ; Varshney, P.K. ; Mehrotra, K.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 244 - 247
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185243
Regular:

Four random test generation strategies are compared to determine their relative effectiveness: equiprobable 0s and 1s; two weighted random pattern generation algorithms; and the maximum output... View More

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