IEEE - Institute of Electrical and Electronics Engineers, Inc. - BISTSYN-a built-in self-test synthesizer

Author(s): Chen, C.-I.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 240 - 243
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185242
Regular:

The author presents a unifying procedure, called three phase cluster partitioning (TPCP), for automated synthesis of a pseudo-exhaustive test generator for built-in self-test (BIST) design. The... View More

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