IEEE - Institute of Electrical and Electronics Engineers, Inc. - Beta: behavioral testability analysis

Author(s): Chen, C.-H. ; Wu, C. ; Saab, D.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 202 - 205
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185231
Regular:

An approach, Beta, for computing testability is presented. This approach is based on analyzing the circuit's behavior description data flow graph (DFG). First, each path in the DFG is analyzed to... View More

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