IEEE - Institute of Electrical and Electronics Engineers, Inc. - DIATEST: a fast diagnostic test pattern generator for combinational circuits

Author(s): Gruning, T. ; Mahlstedt, U. ; Koopmeiners, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 194 - 197
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185229
Regular:

The authors present an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to extend a given... View More

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