IEEE - Institute of Electrical and Electronics Engineers, Inc. - Timing analysis and delay-fault test generation using path-recursive functions

Author(s): McGeer, P.C. ; Saldanha, A. ; Stephan, P.R. ; Brayton, R.K. ; Sangiovanni-Vincentelli, A.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 180 - 183
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185225
Regular:

The authors introduce an efficient method for generating the functional forms of path analysis problems. They demonstrate that the resulting function is linear in the size of the circuit. The... View More

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