IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improved methods for IC yield and quality optimization using surface integrals

Author(s): Feldmann, P. ; Director, S.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 11 November 1991
Page(s): 158 - 161
ISBN (Paper): 0-8186-2157-5
DOI: 10.1109/ICCAD.1991.185219
Regular:

A novel formulation of the parametric yield as a surface integral on the boundary of the disturbance space acceptability region is introduced. This formulation allows the accurate and efficient... View More

Advertisement