IEEE - Institute of Electrical and Electronics Engineers, Inc. - System level diagnosis: Combining detection and location

Author(s): Vaidya, N.H. ; Pradhan, D.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 488 - 495
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146706
Regular:

The problem of system recovery from a large number of faults is addressed. Correlated transient upsets can corrupt the state of a large number of nodes (subsystems). In such a condition, locating... View More

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