IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of deterministic fault injection for fault-tolerant protocol testing

Author(s): Echtle, K. ; Chen, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 418 - 425
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146695
Regular:

A deterministic test strategy consisting of deterministic fault injection at the message level is investigated. Messages sent by faulty units are replaced by such wrong messages that cause all... View More

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