IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault-tolerant memory design in the IBM application system/400

Author(s): Chen, C.L. ; Grosbach, L.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 393 - 400
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146691
Regular:

Some of the fault-tolerant features of the IBM AS/400 main storage subsystem are described, with particular attention to the error-correcting code for the 4-bit-per-chip memory array. Single 4-bit... View More

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