IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pattern sensitive fault testing of RAMs with built-in ECC

Author(s): Franklin, M. ; Saluja, K.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 385 - 392
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146690
Regular:

The problem of testing RAMs with different built-in error-correction-coding (ECC) capabilities is formulated. The basics of ECC in RAMs are reviewed, and some of the implementation aspects... View More

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