IEEE - Institute of Electrical and Electronics Engineers, Inc. - Probabilistic diagnosis algorithms tailored to system topology

Author(s): Rangarajan, S. ; Fussell, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 230 - 237
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146666
Regular:

The authors previously (1989) presented algorithms in which if at least two processors perform tests on any given processor, the probability of correct diagnosis approaches one as N to infinity if... View More

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