IEEE - Institute of Electrical and Electronics Engineers, Inc. - Concurrent error detection and fault-tolerance in linear digital state variable systems

Author(s): Chatterjee, A. ; d'Abreu, M.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 136 - 143
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146652
Regular:

The problem of error detection and correction (both transient and permanent) in linear digital state variable systems, a very large class of circuits used in digital signal processing and control,... View More

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