IEEE - Institute of Electrical and Electronics Engineers, Inc. - Signature analysis and test scheduling for self-testable circuits

Author(s): Strole, A.P. ; Wunderlich, H.-J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 96 - 103
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146640
Regular:

In complex circuits the test execution is usually divided into a number of subtasks, each producing a signature in a self-test register. These signatures influence one another. A model that can be... View More

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