IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test generation for synchronous sequential circuits using multiple observation times

Author(s): Pomeranz, I. ; Reddy, S.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 52 - 59
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146632
Regular:

The test generation problem for synchronous sequential circuits is considered in the case where hardware reset is not available. The observations which form the motivation for the work are given.... View More

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