IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault tolerance testing in the Advanced Automation System

Author(s): Dilenno, T.R. ; Yaskin, D.A. ; Barton, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Montreal, Que., Canada
Conference Date: 25 June 1991
Page(s): 18 - 25
ISBN (Paper): 0-8186-2150-8
DOI: 10.1109/FTCS.1991.146627
Regular:

Fault tolerance testing of the US Federal Aviation Administration's Advanced Automation System (AAS) is discussed. The relationship to previous work is examined, and a high-level description of... View More

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