IEEE - Institute of Electrical and Electronics Engineers, Inc. - Early jump-out corner detectors

Author(s): Cooper, J. ; Venkatesh, S. ; Kitchen, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Maui, HI, USA
Conference Date: 3 June 1991
Page(s): 688 - 689
ISBN (Paper): 0-8186-2148-6
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1991.139783
Regular:

Two corner detectors are presented, one of which works by testing similarity of image patches along the contour direction to detect curves in the image contour, and the other of which uses direct... View More

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