IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust vectorization using graph-based thinning and reliability-based line approximation

Author(s): Suzuki, S. ; Ueda, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Maui, HI, USA
Conference Date: 3 June 1991
Page(s): 494 - 500
ISBN (Paper): 0-8186-2148-6
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1991.139742
Regular:

A vectorization method for line patterns which converts digital binary images into line-segment vectors is proposed. The proposed method suppresses shape distortion as well as pseudo-feature... View More

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