IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fractal probability functions-an application to image analysis

Author(s): Levy Vehel, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Maui, HI, USA
Conference Date: 3 June 1991
Page(s): 378 - 383
ISBN (Paper): 0-8186-2148-6
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1991.139719
Regular:

The extension of the iterated function system (IFS) theory dealing with probability functions instead of numbers is applied to texture analysis. The results allow encoding and reconstruction of... View More

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