IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Use Of A One-bit ADC In Average Evoked Potential Measurment Applications

Author(s): Cedholt, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Orlando, FL, USA
Conference Date: 31 October 1991
Page(s): 431 - 432
ISBN (Paper): 0-7803-0216-8
DOI: 10.1109/IEMBS.1991.684011
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