IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Analysis Of Landmarks In Cephalograms

Author(s): Kuo-sheng Cheng ; Yen-ting Chen ; Jia-kuang Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Orlando, FL, USA
Conference Date: 31 October 1991
Page(s): 338 - 339
ISBN (Paper): 0-7803-0216-8
DOI: 10.1109/IEMBS.1991.683966
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