IEEE - Institute of Electrical and Electronics Engineers, Inc. - Temperature Measurements Using US Tomography : theoretical Aspects

Author(s): Kourtiche, D. ; Nadi, M. ; Kontaxakis, G. ; Marchal, C. ; Prieur, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Orlando, FL, USA
Conference Date: 31 October 1991
Page(s): 325 - 326
ISBN (Paper): 0-7803-0216-8
DOI: 10.1109/IEMBS.1991.683959
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