IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise And Spatial Resolution In Images From A Real-time Electrical Impedance Tomograph

Author(s): Sinton, A.M. ; Brown, B.H. ; Barber, D.C. ; McArdle, F.J. ; Smith, R.W.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1991
Conference Location: Orlando, FL, USA
Conference Date: 31 October 1991
Page(s): 10 - 11
ISBN (Paper): 0-7803-0216-8
DOI: 10.1109/IEMBS.1991.683816
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