IEEE - Institute of Electrical and Electronics Engineers, Inc. - An assembler approach to the automation of test vector generation

Author(s): Perrey, K. ; Manley, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Rochester, NY, USA
Conference Date: 17 September 1990
DOI: 10.1109/ASIC.1990.186180
Regular:

Two schemes for testing user logic in a microcontroller-based ASIC are described. The direct access method consists of multiplexing primary signals with the microcontroller's signals at the... View More

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