IEEE - Institute of Electrical and Electronics Engineers, Inc. - Autonomous test scheme for analog ASICs

Author(s): Lee, N.-C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Rochester, NY, USA
Conference Date: 17 September 1990
DOI: 10.1109/ASIC.1990.186145
Regular:

Analog autonomous test (AAT) is a structured design-for-testability methodology for mixed analog/digital ICs. By using analog switches and test-bus to gain controllability and... View More

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