IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault-tolerant design of VLSI circuits and systems

Author(s): Reddy, P.V.C.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Rochester, NY, USA
Conference Date: 17 September 1990
DOI: 10.1109/ASIC.1990.186075
Regular:

The ever-increasing complexity of very large scale integration (VLSI) has a considerable impact on the design and implementation of fault-tolerant circuits and systems. The techniques of... View More

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