IEEE - Institute of Electrical and Electronics Engineers, Inc. - A resistive-gate two-phase 2DEG CCD for III-V IR detectors

Author(s): Song, J.-I. ; Fossum, E.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: San Francisco, CA, USA, USA
Conference Date: 9 December 1990
Page(s): 267 - 270
ISSN (Paper): 0163-1918
DOI: 10.1109/IEDM.1990.237178
Regular:

A device structure for two-phase operation of a two-dimensional electron gas charge-coupled device (2DEG CCD) has been demonstrated which exhibits a charge transfer efficiency exceeding 0.999 at... View More

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