IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel DC measurement method for the accurate extraction of bipolar resistive parasitics

Author(s): Taft, R.C. ; Plummer, J.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: San Francisco, CA, USA, USA
Conference Date: 9 December 1990
Page(s): 365 - 368
ISSN (Paper): 0163-1918
DOI: 10.1109/IEDM.1990.237155
Regular:

A novel DC method for determining the components of series resistance in bipolar transistors is presented. As a DC technique, it shows unprecedented accuracy as demonstrated by its application to... View More

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