IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical process characterization in advanced analog IC manufacturing

Author(s): Carlson, A.C. ; Sundaram, S.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Washington, DC, USA
Conference Date: 12 February 1989
Page(s): 135 - 140
DOI: 10.1109/IEMT9.1990.114995
Regular:

The device parameter drift of a JFET operational amplifier is discussed in terms of yield loss and product quality of analog ICs. Planned statistical experimentation was used to identify process... View More

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