IEEE - Institute of Electrical and Electronics Engineers, Inc. - A dedicated multichip module automatic optical inspection system

Author(s): Cohen, R. ; Dishon, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1990
Conference Location: Washington, DC, USA
Conference Date: 12 February 1989
Page(s): 51 - 55
DOI: 10.1109/IEMT9.1990.114979
Regular:

The design of an automatic optical inspection (AOI) system for multichip modules (MCMs) is discussed. The system differs from AOI tools designed for other applications due to the special... View More

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